In October PLASUS showcases its latest development for plasma monitoring and process control at TACT 2025 international conferences. Don’t miss the opportunity to discover the unique capabilities of our new EMICON models:

• The EMICON FS SYSTEM for pulse-resolved measurement in HIPIMS applications
• The EMICON LC SYSTEM for in-situ film thickness and color measurement
• Combined in-situ process monitoring of plasma and layer
• The SPECLINE 3 Software

As part of the technical programs, founder and CEO of PLASUS, Dr. Thomas Schütte, will present the following lectures:

Cutting-Edge Process Monitoring Techniques for Thin Film Coatings for Process Development, Production Control and Machine Learning (ML) – INVITED
Symposium G: “Advancing coatings and thin films through characterization, simulation, modeling, and data science“, G-I-428, Tuesday, 28. October 2025, 4:00pm
Thomas Schütte, Jan-Peter Urbach, Peter Neiß, Marius Radloff, Hokuto Kikuchi
At the accompanying industrial exhibition of the TACT 2025 we will display the new EMICON models at our booth. You are cordially invited to stop by and find out more details. We would be pleased to discuss with you possibilities to integrate our products in your applications.

For reviewing the complete program and for registration please refer to the website of the TACT 2025.

We are looking forward to meeting you in Taipei, Taiwan!